CHEN, Jiewei. Research on Automated Software Defect Detection Using Deep Learning Techniques. International Journal of Advance in Applied Science Research, [S. l.], v. 4, n. 12, p. 33–37, 2025. Disponível em: https://www.h-tsp.com/index.php/ijaasr/article/view/205. Acesso em: 5 feb. 2026.